Thermo Scientific focus ion beam (FIB)-Helios 5 CX dualbeam is equipped with highly automated, multisite, fastest and easiest sample preparation for S/TEM.

The key features are:

1. In SEM mode, extreme high resolution (1nm) at low acceleration voltage and 0.6nm at 15kV.

2. In ion beam mode, 4 nm resolution for 30kV.

3. Acceleration voltage for SEM range from 100V-30kV.

4. Acceleration voltage for ion beam range from 500V-30kV.

5. Auto-slice&view and 3-D reconstruction through Avizo software

   .....

• Elstar in-lens SE/BSE detector (TLD-SE, TLD-BSE)
  • Elstar in-column SE/BSE detector (ICD)*
  • Elstar in-column BSE detector (MD)*
  • Everhart-Thornley SE detector (ETD)
  • IR camera for viewing sample/column
  • High-performance in-chamber electron and ion detector (ICE)
  for secondary ions (SI) and electrons (SE)*

• Thermo Scientific In-chamber Nav-Cam Camera for sample
  navigation*

• Retractable annular ring-like ABS detector
  • Retractable, low-voltage, high-contrast, directional, solid-state
  backscatter electron detector (DBS)*
  • Retractable STEM 3+ detector with BF/ DF/ HAADF
  segments*