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Brief description:
The Tecnai G2 F20 microscope is a high performance 200kV scanning transmission electron microscope that offers:
(1)The patented U-TWIN objective lens enables high performance S/TEM imaging with sub nanometer spatial resolution
(2)High spatial coherence and high brightness due to an ultra-stable FEI Schottky source
(3)State-of-the-art, superior stability, high-tension circuitry resulting in an energy spread of less than 0.7 eV
(4)Computerized stage with unique eucentric specification for maximum stability
(5)Accessories include: Slow-scan CCD cameras;High-angle annular dark-field detector (HAADF) for STEM;X-ray energy-dispersive spectrometer (XEDS)。
Specifications:
(1)Schottky Field emitter with high maximum beam current (> 100 nA)
(2)High probe current (> 0.5 nA in a 1 nm spot, > 15 nA in a 10 nm spot)
(3)Small energy spread (0.7 eV or less)
(4)Spot drift < 1 nm/minute
(5)TEM point resolution: 0.19 nm
(6)TEM line resolution: 0.102 nm
(7)Minimum focus step: 0.35 nm
(8)Magnification range: 25x – 1,000kx
(9)STEM HAADF resolution: 0.14 nm
(10)STEM magnification range: 150x – 230Mx
(11)Diffraction angle: ±16˚
(12)Maximum tilt: ± 20˚
(13)Accelerating voltage range of 20 to 200 kV
(14)Available specimen holders: Low-Background Double-tilt, Double-tilt cooling, Double-tilt heating
(15)Fully computer-controlled, eucentric side-entry, high stability CompuStage
(16)X, Y movement 2 mm, specimen size 3 mm
(17)Specimen recall reproducibility ≤ 0.3 μm (x, y) and ≤ 0.1° (α tilt) attainable
(18)Stage Drift < 0.5 nm/minute with a standard holder