Brief description:

The Tecnai G2 F20 microscope is a high performance 200kV scanning transmission electron microscope that offers: 

（1）The patented U-TWIN objective lens enables high performance S/TEM imaging with sub nanometer spatial resolution

（2）High spatial coherence and high brightness due to an ultra-stable FEI Schottky source

（3）State-of-the-art, superior stability, high-tension circuitry resulting in an energy spread of less than 0.7 eV

（4）Computerized stage with unique eucentric specification for maximum stability

（5）Accessories include: Slow-scan CCD cameras；High-angle annular dark-field detector (HAADF) for STEM；X-ray energy-dispersive spectrometer (XEDS)。

Specifications:

（1）Schottky Field emitter with high maximum beam current (> 100 nA)

（2）High probe current (> 0.5 nA in a 1 nm spot, > 15 nA in a 10 nm spot)

（3）Small energy spread (0.7 eV or less)

（4）Spot drift < 1 nm/minute

（5）TEM point resolution: 0.19 nm

（6）TEM line resolution: 0.102 nm

（7）Minimum focus step: 0.35 nm

（8）Magnification range: 25x – 1,000kx

（9）STEM HAADF resolution: 0.14 nm

（10）STEM magnification range: 150x – 230Mx

（11）Diffraction angle: ±16˚

（12）Maximum tilt: ± 20˚

（13）Accelerating voltage range of 20 to 200 kV

（14）Available specimen holders: Low-Background Double-tilt, Double-tilt cooling, Double-tilt heating

（15）Fully computer-controlled, eucentric side-entry, high stability CompuStage

（16）X, Y movement 2 mm, specimen size 3 mm

（17）Specimen recall reproducibility ≤ 0.3 μm (x, y) and ≤ 0.1° (α tilt) attainable

（18）Stage Drift < 0.5 nm/minute with a standard holder